J. Appl. Phys. 88, 6021 (2000); doi:10.1063/1.1318368 (5 pages)
Effect of film thickness on the properties of indium tin oxide thin films
H. Kim, J. S. Horwitz, G. Kushto, A. Piqué, Z. H. Kafafi, C. M. Gilmore, and D. B. Chrisey
Naval Research Laboratory, 4555 Overlook Avenue, SW, Washington, DC 20375 map
(Received 22 May 2000; accepted 23 August 2000)
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